Handbook Of Diagnostic Classification Models Models And Model Extensions, Applications, Software Packages Methodology Of Educational Measurement And Assessment

Matthias Von Davier

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Handbook Of Diagnostic Classification Models Models And Model Extensions, Applications, Software Packages Methodology Of Educational Measurement And Assessment
1. Introduction: From Latent Class Analysis to DINA and Beyond, Matthias von Davier and Young-Sun Lee.- PART 1: Approaches to Cognitive Diagnosis.- 2. Nonparametric Item Response Theory and Mokken Scale Analysis, with Relations to Latent Class Models and Cognitive Diagnostic Models, Andries van der Ark, Gina Rossi, and Klaas Sijtsma.- 3. The Reparameterized Unified...

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Handbook Of Diagnostic Classification Models Models And Model Extensions, Applications, Software Packages Methodology Of Educational Measurement And Assessment

1. Introduction: From Latent Class Analysis to DINA and Beyond, Matthias von Davier and Young-Sun Lee.- PART 1: Approaches to Cognitive Diagnosis.- 2. Nonparametric Item Response Theory and Mokken Scale Analysis, with Relations to Latent Class Models and Cognitive Diagnostic Models, Andries van der Ark, Gina Rossi, and Klaas Sijtsma.- 3. The Reparameterized Unified Model System: A Diagnostic Assessment Modeling Approach, William F. Stout, Robert Henson, Lou DiBello, and Benjamin Shear.- 4. Bayesian Networks, Russell Almond and Diego Zapata.- 5. Nonparametric Classification Models, Chia-Yi Chiu and Hans-Friedrich Kohn.- 6. General Diagnostic Model (GDM), Matthias von Davier.- 7. Generalized Deterministic Inputs, Noisy and Gate Model (G-DINA), Jimmy de la Torre and Nathan Minchen.- 8. Loglinear Cognitive Diagnostic Model (LCDM), Robert Henson and Jonathan Templin.- 9. Diagnostic Modeling of Skill Hierarchies and Cognitive Process with MLTM-D, Susan Embretson.- 10. Explanatory Diagnostic Models, Yoon Soo Park and Young-Sun Lee.- 11. Insights from Reparametrized DINA and Beyond, Lawrence T. DeCarlo.- PART 2:  Special Topics.- 12. Q Matrix Learning via Latent Variable Selection and Identifiability, Jingchen Liu and Hyeon-Ah Kang.- 13. Global Model and Item-level Fit Indices, Zhaungzhuang Han and Matthew Johnson.- 14. Exploratory Data Analysis and Cognitive Diagnostic Model, Yunxiao Chen and Xiaoou Li.- 15. CDM-CAT, Xiaofeng Yu, Ying Cheng, and Hua Hua Chang.- 16. Identifiability and Cognitive Diagnostic Model, Gongjun Xu.- 17. Classification Consistency and Reliability, Sandip Sinharay and Matthew Johnson.- 18. Differential Item Functioning in CDM, Xuelan Qiu, Xiaomin Li, and Wen-Chung Wang.- 19. Parameter Invariance and Skill Attribute Continuity in DCMs: Bifactor MIRT as an Appealing and Related Alternative, Daniel Bolt.- PART 3: Applications.- 20. Application of CDMs to Process Data Analysis, Hong Jiao, Dandan Liao, and Peida Zhan.- 21. Application of CDMs to Learning Systems, Benjamin Deonovic, Pravin Chopade, Michael Yudelson, Jimmy de la Torre, Alina von Davier.- 22. CDMs in Vocational Education, Stephan Abele and Matthias von Davier.- 23. Analyzing Large Scale Assessment Data with Diagnostic Models , Xueli Xu and Matthias von Davier.- 24. Reduced Reparameterized Unified Model Applied to Learning Spatial Reasoning Skills, Susu Zhang, Jeff Douglas, Shiyu Wang, and Steve Culpepper.- 25. How to Conduct a Study with Diagnostic Models , Young-Sun Lee and Diego Luna Bazaldua.- PART 4: Software, Data, and Tools.- 26. The R package CDM for Diagnostic Modeling, Alexander Robitzsch and Ann Cathrice George.- 27. Diagnostic Classification Modeling with flexMIRT, Li Cai and Carrie Houts.- 28. Using Mplus to Estimate the Log-Linear Cognitive Diagnosis Model, Meghan Sullivan, Jesse Pace, and Jonathan Templin.- 29. The GDINA R-package, Wenchao Ma.- 30. GDM software mdltm including Parallel EM algorithm, Lale Khorramdel, Hyo Jeong Shin, and Matthias von Davier.- 31. Estimating CDMs using MCMC, Xiang Liu and Matthew Johnson.


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Tema: Examinations & assessment
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Características

Editora

Springer

Idiomas

Inglês

Data de lançamento

24/10/2019

Peso

1084,0

Colecção

Examinations & assessment

Série/Edição Limitada

1st ed. 2019

EAN

9783030055837

Publicidade
Publicidade