Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs - Hardback - 2012
Ruijing Shen, Sheldon X. D. Tan, Hao Yu
Estado :
Novo
Vendido por
País de expedição : Reino Unido
Resumo
This book covers statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks and analog/mixed-signal circuits. It offers an analysis of each algorithm with applications in real circuit design.
Year of publication: 2012
Pagination: 336 pages, 61 black & white tables, biography
Format: Hardback
Year of publication: 2012
Pagination: 336 pages, 61 black & white tables, biography
Format: Hardback
Statistical Performance Analysis and Modeling Techniques...
Resumo
This book covers statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks and analog/mixed-signal circuits. It offers an analysis of each algorithm with applications in real circuit design.
Year of publication: 2012
Pagination: 336 pages, 61 black & white tables, biography
Format: Hardback
Year of publication: 2012
Pagination: 336 pages, 61 black & white tables, biography
Format: Hardback
Publicidade
Avaliações dos nossos clientes
Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs - Hardback - 2012
Sê o primeiro a dar
a tua opinião sobre este produto
Características
- Editora
-
Springer-Verlag New York Inc.
- Dimensão
-
234 x 156 x 19
- Peso
-
647
- Tema
-
Precision instruments manufacture|Circuits & components
- Edição
-
2012
- Origem
-
United States
- EAN
-
9781461407874
Publicidade
Publicidade