Pattern Recognition and Machine Learning - Proceedings of the Japan-U.S. Seminar on the Learning Process in Control Systems, Held in Nagoya, Japan August 18-20, 1970 - Paperback - 2012
Resumo
Year of publication: 2012
Pagination: 344 pages, biography
Format: Paperback
Editor: King-Sun Fu
Pattern Recognition and Machine Learning - Proceedings of...
Resumo
Year of publication: 2012
Pagination: 344 pages, biography
Format: Paperback
Editor: King-Sun Fu
Publicidade
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Pattern Recognition and Machine Learning - Proceedings of the Japan-U.S. Seminar on the Learning Process in Control Systems, Held in Nagoya, Japan August 18-20, 1970 - Paperback - 2012
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Características
- Editora
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Springer-Verlag New York Inc.
- Dimensão
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254 x 178 x 18
- Peso
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677
- Tema
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Reference works|Chemistry
- Edição
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Softcover reprint of the original 1st ed. 1971
- Origem
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United States
- EAN
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9781461575689
Publicidade
Publicidade