Pattern Recognition and Machine Learning - Proceedings of the Japan-U.S. Seminar on the Learning Process in Control Systems, Held in Nagoya, Japan August 18-20, 1970 - Paperback - 2012

Pattern Recognition and Machine Learning - Proceedings of the Japan-U.S. Seminar on the Learning Process in Control Systems, Held in Nagoya, Japan August 18-20, 1970 - Paperback - 2012 - 1
Resumo

Year of publication: 2012
Pagination: 344 pages, biography
Format: Paperback
Editor: King-Sun Fu

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Resumo


Year of publication: 2012
Pagination: 344 pages, biography
Format: Paperback
Editor: King-Sun Fu
Publicidade

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Pattern Recognition and Machine Learning - Proceedings of the Japan-U.S. Seminar on the Learning Process in Control Systems, Held in Nagoya, Japan August 18-20, 1970 - Paperback - 2012

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Características

Editora

Springer-Verlag New York Inc.

Dimensão

254 x 178 x 18

Peso

677

Tema

Reference works|Chemistry

Edição

Softcover reprint of the original 1st ed. 1971

Origem

United States

EAN

9781461575689

Publicidade
Publicidade