Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance - Hardback - 2013

Kipp van Schooten

Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance - Hardback - 2013 - 1
Resumo
This book lays the groundwork for further use of Electron Spin Echo Envelop Modulation (ESEEM) and opens the possibility of highly precise chemical fingerprinting. It reveals an astonishingly long memory of spin coherence in semiconductor particles.
Year of publication: 2013
Pagination: 127 pages, 28 colour illustrations, biography
Format: Hardback
Serie: Springer Theses

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Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance - Hardback - 2013
Optically Active Charge Traps and Chemical Defects in...

Resumo

This book lays the groundwork for further use of Electron Spin Echo Envelop Modulation (ESEEM) and opens the possibility of highly precise chemical fingerprinting. It reveals an astonishingly long memory of spin coherence in semiconductor particles.
Year of publication: 2013
Pagination: 127 pages, 28 colour illustrations, biography
Format: Hardback
Serie: Springer Theses
Publicidade

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Características

Editora

Springer International Publishing AG

Dimensão

235 x 155 x 13

Peso

330

Tema

Condensed matter physics (liquid state & solid state physics)|Nanotechnology|Semi-conductors & super-conductors|Applied optics

Origem

Switzerland

EAN

9783319005898

Publicidade
Publicidade