X-ray Diffuse Scattering from Self-organized Mesoscopic Semiconductor Structures - Hardback - 2004

This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers.
Year of publication: 2004
Pagination: 204 pages, biography
Format: Hardback
Serie: Springer Tracts in Modern Physics