Lifetime Spectroscopy - A Method of Defect Characterization in Silicon for Photovoltaic Applications - Hardback - 2005
Stefan Rein
Resumo
Year of publication: 2005
Pagination: 492 pages, 29 black & white tables, biography
Format: Hardback
Serie: Springer Series in Materials Science
Lifetime Spectroscopy - A Method of Defect Characterization...
Resumo
Year of publication: 2005
Pagination: 492 pages, 29 black & white tables, biography
Format: Hardback
Serie: Springer Series in Materials Science
Publicidade
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Lifetime Spectroscopy - A Method of Defect Characterization in Silicon for Photovoltaic Applications - Hardback - 2005
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Características
- Editora
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Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
- Dimensão
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235 x 155 x 33
- Peso
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1030
- Tema
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Condensed matter physics (liquid state & solid state physics)|Electronic devices & materials
- Origem
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Germany
- EAN
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9783540253037
Publicidade
Publicidade