Lifetime Spectroscopy - A Method of Defect Characterization in Silicon for Photovoltaic Applications - Paperback - 2010
Stefan Rein
Resumo
Year of publication: 2010
Pagination: 492 pages, 29 black & white tables, biography
Format: Paperback
Serie: Springer Series in Materials Science
Lifetime Spectroscopy - A Method of Defect Characterization...
Resumo
Year of publication: 2010
Pagination: 492 pages, 29 black & white tables, biography
Format: Paperback
Serie: Springer Series in Materials Science
Publicidade
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Lifetime Spectroscopy - A Method of Defect Characterization in Silicon for Photovoltaic Applications - Paperback - 2010
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Características
- Editora
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Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
- Dimensão
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234 x 156 x 26
- Peso
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722
- Tema
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Condensed matter physics (liquid state & solid state physics)|Electronic devices & materials
- Edição
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1st ed. Softcover of orig. ed. 2005
- Origem
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Germany
- EAN
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9783642064531
Publicidade
Publicidade