Semiconductor Material and Device Characterization - Hardback - 2006
Dieter K. Schroder
Resumo
This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully uptodate with the latest developments in the field and includes new pedagogical tools to assist readers.
Year of publication: 2006
Pagination: 800 pages, illustrations
Format: Hardback
Year of publication: 2006
Pagination: 800 pages, illustrations
Format: Hardback
Semiconductor Material and Device Characterization -...
Resumo
This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully uptodate with the latest developments in the field and includes new pedagogical tools to assist readers.
Year of publication: 2006
Pagination: 800 pages, illustrations
Format: Hardback
Year of publication: 2006
Pagination: 800 pages, illustrations
Format: Hardback
Publicidade
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Características
- Editora
-
John Wiley and Sons Ltd
- Idiomas
-
Inglês
- Dimensão
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238 x 164 x 42
- Peso
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1199
- Colecção
-
Mechanical engineering & materials
- Tema
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Semi-conductors & super-conductors
- Edição
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3 Rev ed
- Origem
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United Kingdom
- EAN
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9780471739067
Publicidade
Publicidade