Point Defects in Semiconductors and Insulators - Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions - Paperback - 2012
Johann-Martin Spaeth,Overhof, Harald (University of Paderborn, Germany)
Resumo
Year of publication: 2012
Pagination: 492 pages, biography
Format: Paperback
Serie: Springer Series in Materials Science
Point Defects in Semiconductors and Insulators -...
Resumo
Year of publication: 2012
Pagination: 492 pages, biography
Format: Paperback
Serie: Springer Series in Materials Science
Publicidade
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Point Defects in Semiconductors and Insulators - Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions - Paperback - 2012
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Características
- Editora
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Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
- Dimensão
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234 x 156 x 25
- Peso
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705
- Tema
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Materials science
- Edição
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Softcover reprint of the original 1st ed. 2003
- Origem
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Germany
- EAN
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9783642627224
Publicidade
Publicidade