Transmission Electron Microscopy of Semiconductor Nanostructures - An Analysis of Composition and Strain State - Paperback - 2013
Andreas Rosenauer
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País de expedição : Reino Unido
Resumo
Year of publication: 2013
Pagination: 241 pages, 186 black & white illustrations, 47 colour illustrations, biography
Format: Paperback
Serie: Springer Tracts in Modern Physics
Transmission Electron Microscopy of Semiconductor...
Resumo
Year of publication: 2013
Pagination: 241 pages, 186 black & white illustrations, 47 colour illustrations, biography
Format: Paperback
Serie: Springer Tracts in Modern Physics
Publicidade
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Transmission Electron Microscopy of Semiconductor Nanostructures - An Analysis of Composition and Strain State - Paperback - 2013
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Características
- Editora
-
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
- Dimensão
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235 x 155 x 14
- Peso
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397
- Tema
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Mensuration & systems of measurement|States of matter|Spectrum analysis, spectrochemistry, mass spectrometry|Testing of materials
- Edição
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Softcover reprint of the original 1st ed. 2003
- Origem
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Germany
- EAN
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9783662146187
Publicidade
Publicidade